Plenary
Andrew Bettiol, National University of Singapore, Singapore
“Colour centre engineering using MeV focused ion beams”
Thomas Calligaro, AGLAE/C2RMF Paris, France.
“Wide-field ion imaging spectroscopy of big heritage artefacts“
Hisayoshi Yurimoto, Hokkaido University, Japan.
“Asteroid sample return mission Hayabusa2 and laboratory analyses of the
returned samples“
Invited
Johan Meersschaut, IMEC, Belgium.
“Ensemble Rutherford backscattering analysis of periodic nanostructures“
Iva Božičević Mihalić, Ruđer Bošković Institute, Croatia.
“Developments and applications of High Resolution PIXE at RBI“
Kaoru Nakajima, Kyoto University, Japan.
Daniel Primetzhofer, Uppsala University, Sweden.
“Towards in-situ and in-operando materials analysis using ion beams“
Paula Pongrac, Jožef Stefan Institute, Slovenia.
“Ion microprobe technology applied to the study of plants“
Tiago Fiorini da Silva, University of Sao Paulo, Brazil.
“Expanding applications of machine learning in ion beam analysis“
Udo von Toussaint, Max-Planck-Institut für Plasmaphysik, Garching, Germany.
“Ion impact simulations on crystalline samples using SDTrimSP“
Hongliang Zhang, Institute of Modern physics, Fudan University, China.
“Interfacial phenomena in ceramics under ion beam irradiation“
Zeljko Pastuovic, Australian Nuclear Science and Technology Organisation.
“Testing commercial off-the-shelf electronics for single event effects and total ionizing dose using x-ray, ion and gamma sources”
Hidenori Toyokawa, Japan Synchrotron Radiation Research Institute.
“Development of TlBr hybrid pixel detector for next generation photon counting imaging”