Preliminary Program

Ian Vickridge, INSP, Sorbonne Université, Paris (France)
Fundamental Phenomena: Collision, Stopping Power, Straggling and Channeling

Sigeo Matsuyama, Tohoku University (Japan)
Accelerator and Beam Line

Johnny Ferraz-Dias, UFRGS, Porto Alegre (Brazil)
BS, PIXE, NRA and PIGE

Arnold Müller, LIP-ETH Zurich (Switzerland)
AMS – Basics and Applications

André Vantomme, KU Leuven (Belgium)
The power (and limitations) of ion beam analysis in materials science

Lucile Beck, LMC14/LSCE, Saclay (France)
IBA and AMS Techniques for Cultural Heritage